发明名称 |
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME |
摘要 |
<p>Provided are a semiconductor device and a manufacturing method thereof. The method for manufacturing the semiconductor device comprises forming, on a substrate, a polysilicon film in which a P-conductive first impurity is doped; forming polysilicon patterns and a trench by etching the polysilicon film and the substrate; covering part of the trench, and forming a device separation pattern which covers lower sides of the polysilicon patterns; heating the polysilicon patterns exposed by the device separation pattern under the atmosphere of response gas comprising a P-conductive second impurity; forming a dielectric film and a conductive film on the polysilicon patterns and the device separation pattern; and forming a control gate, a dielectric pattern, and floating gates by etching the conductive film, the dielectric film, and the polysilicon patterns in one direction.</p> |
申请公布号 |
KR20140047933(A) |
申请公布日期 |
2014.04.23 |
申请号 |
KR20120114307 |
申请日期 |
2012.10.15 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, JUNG HWAN;KIM, SUNG GIL;KIM, HONG SUK;YON, GUK HYON;LIM, HUN HYEONG |
分类号 |
H01L21/8247;H01L27/115 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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