发明名称 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 <p>Provided are a semiconductor device and a manufacturing method thereof. The method for manufacturing the semiconductor device comprises forming, on a substrate, a polysilicon film in which a P-conductive first impurity is doped; forming polysilicon patterns and a trench by etching the polysilicon film and the substrate; covering part of the trench, and forming a device separation pattern which covers lower sides of the polysilicon patterns; heating the polysilicon patterns exposed by the device separation pattern under the atmosphere of response gas comprising a P-conductive second impurity; forming a dielectric film and a conductive film on the polysilicon patterns and the device separation pattern; and forming a control gate, a dielectric pattern, and floating gates by etching the conductive film, the dielectric film, and the polysilicon patterns in one direction.</p>
申请公布号 KR20140047933(A) 申请公布日期 2014.04.23
申请号 KR20120114307 申请日期 2012.10.15
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, JUNG HWAN;KIM, SUNG GIL;KIM, HONG SUK;YON, GUK HYON;LIM, HUN HYEONG
分类号 H01L21/8247;H01L27/115 主分类号 H01L21/8247
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