发明名称 TRANSMISSION ELECTRON MICROSCOPE, AND METHOD OF OBSERVING SPECIMEN
摘要 <p>Provided is means which enables observation of the shape of a specimen as it is without deforming the specimen. Observation is made by allowing a specimen-holding member having an opening (for example, microgrid and mesh) to hold an ionic liquid and charging a specimen thereto, to allow the specimen to suspend in the ionic liquid. Furthermore, in the proximity of the specimen-holding member, a mechanism of injecting an ionic liquid (ionic liquid introduction mechanism) and/or an electrode are provided. When a voltage is applied to the electrode, the specimen moves or deforms in the ionic liquid. How the specimen moves or deforms can be observed. Furthermore, in the proximity of specimen-holding member, an evaporation apparatus is provided to enable charge of the specimen into the ionic liquid while evaporating. Furthermore, in the proximity of the specimen-holding member, a microcapillary is provided to charge a liquid-state specimen into the ionic liquid. Note that the specimen-holding member is designed to be rotatable.</p>
申请公布号 EP2273528(A4) 申请公布日期 2014.04.23
申请号 EP20090738779 申请日期 2009.04.27
申请人 HITACHI HIGH-TECHNOLOGIES CORPORATION 发明人 NAKAZAWA EIKO;KOBAYASHI HIROYUKI;KUWABATA SUSUMU
分类号 H01J37/20;G01N1/28;G01N1/40;G01N23/225;H01J37/26 主分类号 H01J37/20
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