| 摘要 |
A contact (12) for use in a contact set assembly. The contact (12) spans a space which separates a lead (20) of an integrated circuit (22) to be tested and a pad (24) of a load board (26) interfacing with the tester. The contact construction provides electrical communication between integrated circuit lead (20) and the load board pad (24). Included is an insulating lamina which comprises, in part, a contact. A conductive lamina overlies at least a portion of the insulating lamina. The laminar construction and size and shape of conductive traces applied to a ceramic lamina enable parameters of the contact (12) to be provided. |
