| 发明名称 |
METHOD FOR INSPECTING ELECTRONIC DEVICE AND ELECTRONIC DEVICE INSPECTION APPARATUS |
| 摘要 |
Provided is a method for inspecting an electronic device, in which an inspection of electrical characteristics is carried out by using a conduction means to pass a current to an electronic device while the electronic device is being continuously conveyed. |
| 申请公布号 |
EP2723147(A1) |
申请公布日期 |
2014.04.23 |
| 申请号 |
EP20120800543 |
申请日期 |
2012.05.23 |
| 申请人 |
KONICA MINOLTA, INC. |
发明人 |
ARITA, HIROAKI;MASUDA, OSAMU |
| 分类号 |
H05B33/12;G01R31/00;G02F1/1362;G09G3/00;G09G3/32;H01L31/04;H01L51/50 |
主分类号 |
H05B33/12 |
| 代理机构 |
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代理人 |
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| 主权项 |
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