发明名称 |
SYSTEM AND METHOD FOR DETECTION AND MEASUREMENT OF INTERFACIAL PROPERTIES IN SINGLE AND MULTILAYER OBJECTS |
摘要 |
A system for determining a material property at an interface between a first layer and a second layer includes a transmitter outputting electromagnetic radiation to the sample, a receiver receiving electromagnetic radiation that was reflected by or transmitted though the sample, and a data acquisition device. The data acquisition device digitizes the electromagnetic radiation to yield waveform data. The waveform data represents the radiation reflected by or transmitted though the sample. The material property to be determined is generally the adhesive strength between the first and second layers. |
申请公布号 |
EP2488849(A4) |
申请公布日期 |
2014.04.23 |
申请号 |
EP20100823999 |
申请日期 |
2010.10.13 |
申请人 |
PICOMETRIX, LLC |
发明人 |
WHITE, JEFFREY, S.;FICHTER, GREGORY, D.;DULING, IRL;ZIMDARS, DAVID |
分类号 |
G01N19/04;G01N21/35 |
主分类号 |
G01N19/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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