发明名称 REFLECTIVE MASK BLANK FOR EXPOSURE, REFLECTIVE MASK FOR EXPOSURE, SEMICONDUCTOR DEVICE MANUFACTURING METHOD, AND SUBSTRATE WITH MULTILAYERED REFLECTIVE FILMS
摘要 To provide a reflective mask blank for exposure that can solve a problem of adsorption failure in fixing a reflective mask using an electrostatic chuck and thus can flatten the surface of the mask using the electrostatic chuck, thereby realizing high-accuracy pattern transfer. In a reflective mask blank for exposure having a multilayer reflective film formed on a board and adapted to reflect exposure light and an absorbent layer formed on the multilayer reflective film and adapted to absorb the exposure light, the shape of a surface of the mask blank on its side opposite to its transfer pattern forming surface is a shape having a convex surface.
申请公布号 KR101388828(B1) 申请公布日期 2014.04.23
申请号 KR20070104328 申请日期 2007.10.17
申请人 发明人
分类号 G03F1/22;G03F1/24;G03F1/60;G03F7/20;H01L21/027 主分类号 G03F1/22
代理机构 代理人
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