发明名称 Circuits and techniques to compensate data signals for variations of parameters affecting memory cells in cross point arrays
摘要 Embodiments of the invention relate generally to semiconductors and memory technology, and more particularly, to systems, integrated circuits, and methods to implement circuits configured to compensate for parameter variations that affect the operation of memory elements, such as memory elements based on third dimensional memory technology. In at least some embodiments, an integrated circuit includes a cross-point array comprising memory elements disposed among word lines and bit lines, where a parameter can affect the operating characteristics of a memory element. The integrated circuit further includes a data signal adjuster configured to modify the operating characteristic to compensate for a deviation from a target value for the operating characteristic based on the parameter. In some embodiments, the memory element, such as a resistive memory element, is configured to generate a data signal having a magnitude substantially at the target value independent of variation in the parameter.
申请公布号 US8705260(B2) 申请公布日期 2014.04.22
申请号 US201213728676 申请日期 2012.12.27
申请人 UNITY SEMICONDUCTOR CORPORATION 发明人 CHEVALLIER CHRISTOPHE;LIM SEOW FONG;SIAU CHANG HUA
分类号 G11C5/02;G11C11/21 主分类号 G11C5/02
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