发明名称 Method and apparatus for developing process
摘要 The present disclosure involves a method of fabricating a semiconductor device. The method includes providing a substrate having a material layer formed thereon; depositing a photoresist layer on the material layer, the photoresist layer having a vertical dimension; exposing a region of the photoresist layer to radiation, the exposed region having a horizontal dimension, wherein a first ratio of the vertical dimension to the horizontal dimension exceeds a predetermined ratio; and developing the photoresist layer to remove the exposed region at least in part through applying a developer solution containing a first chemical and a second chemical, wherein: the first chemical is configured to dissolve the exposed region of the photoresist layer through a chemical reaction; the second chemical is configured to enhance flow of the first chemical that comes into contact with the photoresist layer; and an optimized second ratio exists between the first chemical and the second chemical.
申请公布号 US8703392(B2) 申请公布日期 2014.04.22
申请号 US201213602445 申请日期 2012.09.04
申请人 LIU YU-LUN;LIU CHIA-CHU;CHEN KUEI-SHUN;WANG CHUNG-MING;SU YING-HAO;TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 LIU YU-LUN;LIU CHIA-CHU;CHEN KUEI-SHUN;WANG CHUNG-MING;SU YING-HAO
分类号 G03F7/26;B05B7/00;B05C11/00 主分类号 G03F7/26
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