发明名称 Test head moving apparatus and electronic component testing apparatus
摘要 A test head moving apparatus includes elevating arms that move a test head up and down, a frame that horizontally moves the test head, and an interlock mechanism that prohibits the horizontal movement of the frame on the basis of a height of the test head. The interlock mechanism has a limit switch that detects that the test head is positioned at the lowermost limit and stoppers capable of pressing the pressing units onto a floor plane.
申请公布号 US8704543(B2) 申请公布日期 2014.04.22
申请号 US200813003953 申请日期 2008.07.14
申请人 YANO TAKAYUKI;ADVANTEST CORPORATION 发明人 YANO TAKAYUKI
分类号 G01R31/00 主分类号 G01R31/00
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