发明名称 |
Method and system to compensate for temperature and pressure in piezo resistive devices |
摘要 |
A method and system to calibrate temperature and pressure in piezo resistive devices for non-linear sensors having two variables, where a piezo resistive device such as a piezo resistive transducer (PRT) used for example in a pressure sensor system is calibrated to calculate actual/ambient temperature and pressure even though the PRT impedance is unbalanced relative to pressure. |
申请公布号 |
US8701460(B2) |
申请公布日期 |
2014.04.22 |
申请号 |
US201113077963 |
申请日期 |
2011.03.31 |
申请人 |
KRISHNA SIDDHARTHA GOPAL;DAWSON CHAD S.;VARMA VIKRAM;FREESCALE SEMICONDUCTOR, INC. |
发明人 |
KRISHNA SIDDHARTHA GOPAL;DAWSON CHAD S.;VARMA VIKRAM |
分类号 |
G01L27/00 |
主分类号 |
G01L27/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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