发明名称 |
Height measurement by correlating intensity with position of scanning object along optical axis of a structured illumination microscope |
摘要 |
A method for imaging an object using a microscope includes obtaining axial response data, the axial response data representative of a relationship between a separation between a top surface of the object and an objective lens of the microscope and an intensity of light reflected by the top surface of the object; positioning the object at a distance from the objective lens that is within a linear region of the axial response data; sequentially illuminating the object with a plurality of periodic patterns; obtaining a plurality of images of the object, each image resulting from the illumination of the object with a corresponding one of the plurality of periodic patterns; determining a reconstructed image of the object based on the plurality of images of the object; and, based on variations in the intensity of the reconstructed image, determining a topographic profile of the top surface of the object. |
申请公布号 |
US8705043(B2) |
申请公布日期 |
2014.04.22 |
申请号 |
US20100966207 |
申请日期 |
2010.12.13 |
申请人 |
LEE CHAU-HWANG;WANG CHUN-CHIEH;ACADEMIA SINICA |
发明人 |
LEE CHAU-HWANG;WANG CHUN-CHIEH |
分类号 |
G01B9/021;G01B11/24;G01B11/30 |
主分类号 |
G01B9/021 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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