发明名称 DEFECT FACTOR DETERMINATION DEVICE, DEFECT OCCURRENCE PREDICTOR, DEFECT FACTOR DETERMINATION SYSTEM, DEFECT FACTOR DETERMINATION METHOD, AND PROGRAM
摘要 PROBLEM TO BE SOLVED: To identify a defect factor at defect occurrence in injection molding.SOLUTION: A defect factor determination device includes: a defect information acquisition part that acquires defect occurrence place information and defect classification information in injection molding; an object to be injected arrival time acquisition part that acquires a time at which an object to be injected arrives at a defect occurrence place which the defect occurrence place information indicates; a process value acquisition part that acquires a defect occurrence place arrival time process value that is a process value of an injection molding machine at the time at which an object to be injected arrives at a defect occurrence place; and a defect factor determination part that determines a defect factor based on the defect classification which defect classification information indicates and the defect occurrence place arrival time process value.
申请公布号 JP2014069382(A) 申请公布日期 2014.04.21
申请号 JP20120216110 申请日期 2012.09.28
申请人 NEC CORP 发明人 SAITO JUNYA
分类号 B29C45/76 主分类号 B29C45/76
代理机构 代理人
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