发明名称 |
SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE MANUFACTURING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device which has low on-resistance and enables normally-off.SOLUTION: A semiconductor device comprises: an electron transit layer formed on a substrate; an electron supply layer formed on the electron transit layer; a doping layer which is formed on the electron supply layer and formed from a nitride semiconductor doped by an impurity element to become a p-type and C; a p-type layer which is formed on the doping layer and formed from a nitride semiconductor doped by an impurity element to become a p-type; a gate electrode formed on the p-type layer; and a source electrode and a drain electrode which are formed on the doping layer or the electron supply layer. The p-type layer is formed in a region just below the gate electrode. A concentration of C doped in the doping layer is not less than 1×10cmand not more than 1×10cm. |
申请公布号 |
JP2014072426(A) |
申请公布日期 |
2014.04.21 |
申请号 |
JP20120218246 |
申请日期 |
2012.09.28 |
申请人 |
FUJITSU LTD |
发明人 |
YAMADA ATSUSHI |
分类号 |
H01L27/098;H01L21/205;H01L21/337;H01L21/338;H01L29/778;H01L29/808;H01L29/812;H02M3/28;H02M7/12 |
主分类号 |
H01L27/098 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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