光学检测装置与光学检测方法,申请号TW100122757-传众专利搜索

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发明名称	光学检测装置与光学检测方法
摘要
申请公布号	TWI435074	申请公布日期	2014.04.21
申请号	TW100122757	申请日期	2011.06.29
申请人	旺矽科技股份有限公司新竹县竹北市中和街155号	发明人	周明澔;刘羿辰;谢志永;蔡振扬
分类号	G01N21/88;G01N35/10	主分类号	G01N21/88
代理机构		代理人	陈思源台北市中正区八德路1段23号8楼
主权项
地址	新竹县竹北市中和街155号

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