发明名称 CHARGED PARTICLE BEAM APPARATUS, POSITION ADJUSTING METHOD OF PARTITIONING FILM, AND PARTITIONING FILM POSITION-ADJUSTING JIG
摘要 PROBLEM TO BE SOLVED: To solve the problem that, in a charged particle beam apparatus for observing under the atmospheric environment or a gas atmosphere of a pressure substantially equal to the atmospheric pressure, since a partitioning film for isolating an atmospheric pressure space in which a specimen is placed from a vacuum space within an electron-optical lens barrel is extremely thin, the partitioning film is highly possible to be damaged and when exchanging the partitioning film, it becomes necessary to adjust a partitioning film position, however, according to methods of the prior arts, the partitioning film position cannot be easily adjusted.SOLUTION: A charged particles beam device configured to employ a thin film for partitioning between a vacuum atmosphere, and the atmospheric environment or a gas atmosphere, comprises: a removable partitioning film through which primary charged-particle beam is transmitted or passed, isolating a space in which a specimen is placed so as to keep a pressure in the space where the specimen is placed higher than a pressure within a housing; and a movable member capable of moving the partitioning film while keeping the pressure in the space where the specimen is placed and the pressure within the housing.
申请公布号 JP2014072111(A) 申请公布日期 2014.04.21
申请号 JP20120219018 申请日期 2012.10.01
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 KASAI SHINSUKE;OMINAMI YUSUKE;YASUJIMA MASAHIKO;SUZUKI HIROMASA
分类号 H01J37/18;H01J37/16 主分类号 H01J37/18
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