| 摘要 |
PROBLEM TO BE SOLVED: To provide an optical measuring apparatus that shows good detection accuracy, and an optical measuring microchip that allows for good detection accuracy.SOLUTION: There is provided an optical measuring apparatus including a control unit that compensates detection light generated from a reaction area in a microchip, based on optical information from a detection-light-quantity calibration area. The detection-light-quantity calibration area may be provided at an exterior and/or an interior of the microchip. There is also provided an optical measuring microchip in which an adhesion layer having an ID area is formed. The ID area may further contain assay information and/or chip information. |
