发明名称 |
RESIST COMPOSITION, METHOD FOR FORMING RESIST PATTERN, POLYMERIC COMPOUND, AND COMPOUND |
摘要 |
PROBLEM TO BE SOLVED: To provide a resist composition which has high solubility with an alkali developing solution while maintaining lithographic characteristics and which can achieve reduction of defects, and to provide a method for forming a resist pattern using the resist composition.SOLUTION: The resist composition generates an acid by exposure and exhibits changes in the solubility with an alkali developing solution by an action of the acid. The composition comprises a polymeric compound having a structural unit that includes a base decomposable group and is crosslinked by a crosslinking structure. |
申请公布号 |
JP2014071159(A) |
申请公布日期 |
2014.04.21 |
申请号 |
JP20120215133 |
申请日期 |
2012.09.27 |
申请人 |
TOKYO OHKA KOGYO CO LTD |
发明人 |
TAKAGI DAICHI;ARAI MASATOSHI;YOKOYA JIRO |
分类号 |
G03F7/039;C08F20/22;H01L21/027 |
主分类号 |
G03F7/039 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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