发明名称 RESIST COMPOSITION, METHOD FOR FORMING RESIST PATTERN, POLYMERIC COMPOUND, AND COMPOUND
摘要 PROBLEM TO BE SOLVED: To provide a resist composition which has high solubility with an alkali developing solution while maintaining lithographic characteristics and which can achieve reduction of defects, and to provide a method for forming a resist pattern using the resist composition.SOLUTION: The resist composition generates an acid by exposure and exhibits changes in the solubility with an alkali developing solution by an action of the acid. The composition comprises a polymeric compound having a structural unit that includes a base decomposable group and is crosslinked by a crosslinking structure.
申请公布号 JP2014071159(A) 申请公布日期 2014.04.21
申请号 JP20120215133 申请日期 2012.09.27
申请人 TOKYO OHKA KOGYO CO LTD 发明人 TAKAGI DAICHI;ARAI MASATOSHI;YOKOYA JIRO
分类号 G03F7/039;C08F20/22;H01L21/027 主分类号 G03F7/039
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