发明名称 WET ETCHING DEVICE AND MANUFACTURING METHOD FOR SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To solve such a problem of conventional wet etching method and wet etching device of a semiconductor wafer by phosphorus acid, in which etchant in a processing tank is discharged by discharge means when the Si concentration in the etchant reaches a predetermined concentration, and new etchant is replenished by supply means, that control of etchant concentration is poor and thereby stabilized etching is impossible.SOLUTION: A wet etching device performs small amount of liquid exchange for discharging the liquid when the etching exceeds a set process integration (number of processed sheets×processing time), continuing liquid discharge even after a small amount liquid exchange liquid discharge sensor is turned on, and stopping liquid discharge by turning a valve off upon elapsing a predetermined time. A manufacturing method for a semiconductor device in which wet etching of a semiconductor wafer is performed by the wet etching device is also provided.
申请公布号 JP2014072505(A) 申请公布日期 2014.04.21
申请号 JP20120220102 申请日期 2012.10.02
申请人 RENESAS ELECTRONICS CORP 发明人 MATSUFUNE KUMIKO
分类号 H01L21/306 主分类号 H01L21/306
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