发明名称 INTEGRITY EVALUATION SYSTEM FOR SENSOR
摘要 Disclosed is an integrity evaluation system for a sensor, which directly applies a quantified specific frequency to an evaluation target sensor to sense an output from the sensor, thereby performing a feature analysis, recording, and management. The integrity evaluation system according to present invention includes: a keypad for selecting an integrity evaluation condition of a sensor; an oscillating unit for oscillating a frequency specified according to the control of a control unit to input oscillation or a sound wave into the directly touching sensor; the control unit setting the evaluation condition of the sensor according to the selection of the keypad, oscillating the specified frequency according to the set evaluation condition to operate the oscillating unit, and evaluating the integrity of the sensor by sensing and analyzing a response speed and voltage intensity of the sensor according to the oscillated specified frequency; a display unit for displaying the integrity evaluation condition and the analyzed evaluation result in a predetermined form according to a signal applied to the control unit; and a memory for storing the integrity evaluation result of the sensor for each evaluation date at in a designated region according to the control of the control unit. [Reference numerals] (101) Keypad; (102) Display; (103) Input/output processor; (104) Control unit; (105) Oscillator; (106) Transducer; (108) First amplifier; (109) Filter; (110) Second amplifier; (111) AD converter; (112) Memory; (113) SPI processor; (114) USB port; (115) Printer operating unit; (116) Printer; (120) Power unit; (200) Sensor
申请公布号 KR101387672(B1) 申请公布日期 2014.04.21
申请号 KR20130105734 申请日期 2013.09.03
申请人 HANA EVERTECH CO., LTD. 发明人 YUN, MIN;HONG, YANG IL;YANG, DAE YEON;CHOI, BYOUNG YOON
分类号 G01M99/00;G01D21/00;G01H17/00;G01M3/00 主分类号 G01M99/00
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