发明名称 INSPECTION CHIP, METHOD OF MANUFACTURING COVER MEMBER, AND INSPECTION SYSTEM
摘要 PROBLEM TO BE SOLVED: To provide an inspection chip allowing acquisition of a more accurate inspection result in an inspection system where an inspection liquid is inspected by optical measurement.SOLUTION: The inspection chip is loaded to an inspection device including a light source for generating light having a prescribed emission intensity and a light receiving sensor part for receiving the light generated from the light source and is capable of housing an inspection liquid moving in a prescribed flow passage in accordance with revolution due to the inspection device and a prescribed angle held by rotation due to the inspection device and includes a plate member having the flow passage formed therein and a cover member joined to the plate member so as to surround the flow passage. The plate member includes a first measurement part which houses the inspection liquid after movement in the flow passage and is arranged in such a position that the light from the light source can be transmitted to the housed inspection liquid, and the cover member includes a second measurement part which is arranged in a position different from that of the first measurement part in a state where the cover member is joined to the plate member and has second optical characteristics different from first optical characteristics of the cover member.
申请公布号 JP2014066540(A) 申请公布日期 2014.04.17
申请号 JP20120210448 申请日期 2012.09.25
申请人 BROTHER IND LTD 发明人
分类号 G01N35/08;G01N21/59;G01N35/00;G01N37/00 主分类号 G01N35/08
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