发明名称 |
THICKNESS DEVIATION MEASUREMENT METHOD OF OPTICAL FIBER, THICKNESS DEVIATION MEASUREMENT INSTRUMENT OF OPTICAL FIBER, METHOD OF MANUFACTURING OPTICAL FIBER, APPARATUS FOR MANUFACTURING OPTICAL FIBER |
摘要 |
PROBLEM TO BE SOLVED: To provide a thickness deviation measurement method of an optical fiber and a thickness deviation measurement instrument of an optical fiber, which enable lengthwise-direction variance in thickness deviation of an optical fiber coating to be accurately measured with simple configuration, and to provide a method of manufacturing an optical fiber, and an apparatus for manufacturing an optical fiber.SOLUTION: It is determined whether thickness deviation of an ultraviolet curable resin 2 of an optical fiber F varies or not on the basis of an optical detection signal S1 obtained by detecting ultraviolet light U with which the ultraviolet curable resin 2 is irradiated to be cured and which propagates in the ultraviolet curable resin 2 and is scattered to the outside. |
申请公布号 |
JP2014066558(A) |
申请公布日期 |
2014.04.17 |
申请号 |
JP20120210719 |
申请日期 |
2012.09.25 |
申请人 |
FUJIKURA LTD |
发明人 |
MATSUSHITA SHINGO |
分类号 |
G01M11/00;C03B37/027;C03C25/12 |
主分类号 |
G01M11/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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