发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device and a manufacturing method of the same, which can suppress manufacturing cost.SOLUTION: A semiconductor device 1 comprises as shown in the selected drawing: a P type semiconductor substrate 2; an N type diffusion layer 4 which is formed in the semiconductor substrate 2 and in which an N type first impurity diffuses from a surface 20 of the semiconductor substrate 2 to a predetermined depth d; and a P type diffusion layer 6 which is formed in the semiconductor substrate 2 and in which a first conductivity type second impurity having a concentration lower than that of the first impurity diffuses from the surface 20 to a depth dshallower than the N type diffusion layer 4 and which is surrounded by the N type diffusion layer 4; an insulation film 10 formed on the second diffusion layer; and a first electrode 12 arranged on the insulation film 10.
申请公布号 JP2014067853(A) 申请公布日期 2014.04.17
申请号 JP20120211957 申请日期 2012.09.26
申请人 TOKAI RIKA CO LTD 发明人 SHIMA KENGO
分类号 H01L21/822;H01L27/04 主分类号 H01L21/822
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