发明名称 OPTICAL MEASUREMENT SYSTEM, METHOD AND SCALEPLATE THEREFOR
摘要 Embodiment of the present invention provides various types of optical measurement scaleplates, optical measurement apparatus and method using the optical measurement scaleplates for position measurements. In one embodiment, an optical measurement scaleplate has a substrate and a plurality of marking units each being borne on the substrate at a predetermined position. Each marking unit includes a plurality of optically detectable marking elements. Each of said marking elements has an element value defined a permutation of the element value of each of the marking elements in said marking unit, and each unit value corresponds to a physical quantity. On the substrate there is defined a first direction. The physical quantity includes a first distance between a reference position and said predetermined position along the first direction.
申请公布号 WO2014058390(A1) 申请公布日期 2014.04.17
申请号 WO2013SG00395 申请日期 2013.09.10
申请人 WANG, YONG 发明人 WANG, YONG
分类号 G01B11/00;G01C15/06;G01D5/347 主分类号 G01B11/00
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