发明名称 SILICON SUBSTRATE ETCHING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a silicon substrate etching method which can solve stagnation of an etchant and improve deterioration in an etching rate on a wafer surface by improving replaceability of the etchant.SOLUTION: In an etching method of a silicon substrate of forming an intended recess by fixing a chamber with a silicon substrate which has an etching mask layer on a first surface so as to expose the etching mask layer in the chamber and by etching the silicon substrate through the etching mask layer by an etchant flowing in the chamber from an upstream side to a downstream side, the etching mask layer includes an etching opening 2 corresponding to the recess and a dummy opening 3 on an upstream side of the etching opening and aligned with the etching opening.
申请公布号 JP2014067773(A) 申请公布日期 2014.04.17
申请号 JP20120210486 申请日期 2012.09.25
申请人 CANON INC 发明人 FURUSAWA KENTA;KOYAMA SHUJI;MATSUMOTO KEIJI;FUJITA HIROHISA;MURAKAMI RYOTARO
分类号 H01L21/306;B41J2/16 主分类号 H01L21/306
代理机构 代理人
主权项
地址