MAGNETIC HEAD INSPECTION DEVICE, AND MAGNETIC HEAD INSPECTION METHOD

摘要

PROBLEM TO BE SOLVED: To provide a magnetic head inspection device and a magnetic head inspection method capable of shortening an inspection time by scanning and efficiently inspecting the magnetic head.SOLUTION: A cantilever of a magnetic force microscope provided with a magnetic probe on a tip is oscillated with a predetermined frequency, detects a specified position of a writing head based on a search two dimensional magnetic field intensity by floating the magnetic probe above the writing head of a magnetic head, sets a shape detection range for detecting a shape of the writing head narrower than the search range based on the specified position, and detects the shape of the writing head by detecting the search two dimensional magnetic field intensity of the writing head showing an oscillating state of the cantilever means during the two dimensional scanning of the shape detection range by floating the magnetic probe above the writing head.