发明名称 |
SUBSTRATE PROCESSING DEVICE, SUBSTRATE PROCESSING METHOD AND SEMICONDUCTOR DEVICE MANUFACTURING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide a substrate processing device which is equipped with an air flow with particular emphasis on countermeasures against heat by reducing stagnation of heat in a transfer chamber; and provide a substrate processing method and a semiconductor device manufacturing method.SOLUTION: A substrate processing device comprises: a processing chamber for processing a substrate 95; a transfer chamber 12 in which a substrate holder holds the substrate and waiting before the substrate 95 is carried in the processing chamber; a cyclic path for circulating at least one of or both of an inert gas and clean air in the transfer chamber 12; a cyclic path on-off valve arranged in the cyclic path for opening/closing the cyclic path; a supply path for supplying at least one of or both of the inert gas and the clean air to the cyclic path; a discharge path for discharging at least one of or both of the inert gas and the clean air from the cyclic path; a discharge path on-off valve arranged in the discharge path for opening/closing the discharge path; and an exhaust path which is arranged on an upper part of the transfer chamber and different from the discharge path. |
申请公布号 |
JP2014067979(A) |
申请公布日期 |
2014.04.17 |
申请号 |
JP20120214274 |
申请日期 |
2012.09.27 |
申请人 |
HITACHI KOKUSAI ELECTRIC INC |
发明人 |
YOSHIDA HIDENARI;TANIYAMA TOMOSHI |
分类号 |
H01L21/677;H01L21/02 |
主分类号 |
H01L21/677 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|