发明名称 SUBSTRATE PROCESSING DEVICE, SUBSTRATE PROCESSING METHOD AND SEMICONDUCTOR DEVICE MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a substrate processing device which is equipped with an air flow with particular emphasis on countermeasures against heat by reducing stagnation of heat in a transfer chamber; and provide a substrate processing method and a semiconductor device manufacturing method.SOLUTION: A substrate processing device comprises: a processing chamber for processing a substrate 95; a transfer chamber 12 in which a substrate holder holds the substrate and waiting before the substrate 95 is carried in the processing chamber; a cyclic path for circulating at least one of or both of an inert gas and clean air in the transfer chamber 12; a cyclic path on-off valve arranged in the cyclic path for opening/closing the cyclic path; a supply path for supplying at least one of or both of the inert gas and the clean air to the cyclic path; a discharge path for discharging at least one of or both of the inert gas and the clean air from the cyclic path; a discharge path on-off valve arranged in the discharge path for opening/closing the discharge path; and an exhaust path which is arranged on an upper part of the transfer chamber and different from the discharge path.
申请公布号 JP2014067979(A) 申请公布日期 2014.04.17
申请号 JP20120214274 申请日期 2012.09.27
申请人 HITACHI KOKUSAI ELECTRIC INC 发明人 YOSHIDA HIDENARI;TANIYAMA TOMOSHI
分类号 H01L21/677;H01L21/02 主分类号 H01L21/677
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