发明名称 CLOCK SIGNAL SELF-TEST CIRCUIT
摘要 PROBLEM TO BE SOLVED: To provide a clock signal self-test circuit capable of self-testing a clock signal generated by a first power supply voltage using a circuit element operated by a second power supply voltage and preventing occurrence of short circuit current regardless of the status of the power supply voltages.SOLUTION: A clock signal self-test circuit has such a configuration that a clock signal generation circuit 14 is connected to a microcomputer 16 via a clock signal transmission line 25 and a clock signal can be tested by a timer counter 19. A power supply circuit 8 generates a power supply voltage VA when a battery 4 is connected to a substrate 2, but a power supply circuit 9 does not generate a power supply voltage VB when a power supply switch 13 is off, and a load circuit 15 and the microcomputer 16 stop their operations. At this time, a switching circuit 27 electrically cuts off the connection between an output terminal 14a of the clock generation circuit 14 and an input terminal 16a of the microcomputer 16. As a result, a short circuit current is prevented from flowing from the clock signal generation circuit 14 to a power supply line 11 via the clock signal transmission line 25 and an input protection diode of the timer counter 19.
申请公布号 JP2014067145(A) 申请公布日期 2014.04.17
申请号 JP20120210793 申请日期 2012.09.25
申请人 DENSO CORP 发明人 KATO KEIJI;INAYOSHI KIMINOBU;TAKASU KAZUHIRO
分类号 G06F1/04 主分类号 G06F1/04
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