发明名称 ERROR CORRECTION CODE CIRCUIT AND MEMORY DEVICE INCLUDING THE SAME
摘要 The ECC circuit includes a Chien search unit configured to determine whether there is an error in each bit of a data sequence. The Chien search unit selects a coefficient of a nonlinear term from among terms of an error locator polynomial as a nonlinear coefficient, separates the error locator polynomial into a first location equation including only linear terms and a second location equation including only nonlinear terms, determines a third location equation by dividing the first location equation by the nonlinear coefficient, determines a fourth location equation by dividing the second location equation by the nonlinear coefficient, and determines whether there is an error for each of the bits by performing an XOR operation on a result of the third location equation using the substitution value and a result of the fourth location equation using an arbitrary element of the error locator polynomial as a substitution value.
申请公布号 US2014108895(A1) 申请公布日期 2014.04.17
申请号 US201314054190 申请日期 2013.10.15
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 FUJIWARA DAISUKE
分类号 H03M13/07 主分类号 H03M13/07
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