DEVICE AND METHOD FOR DETERMINING MATERIAL PROPERTIES OF A SUBSTRATE SAMPLE IN THE TERAHERTZ FREQUENCY SPECTRUM

摘要

The invention relates to a device and a method for determining material properties of a coated or uncoated substrate sample in the electromagnetic terahertz frequency spectrum, in particular a substrate sample which is coated with at least one layer and which is preferably reinforced with fibers. The invention is characterized in that the substrate sample is illuminated with at least two terahertz light pulses of different polarizations, in particular with the same beam cross-section, said light pulses propagating in a collinear manner and being generated by at least two terahertz emitters. The terahertz light pulses that are reflected by the substrate sample and/or transmitted through the substrate sample are measured with respect to the intensity and/or electric field strength in at least two, preferably three different polarization directions in a time-resolved manner.