| 摘要 |
A system and method for deriving a sequence of OLED non-uniformity test patterns. A pattern generator generates a full sequence of display patterns according to a transform function, such as a discrete cosine transformation or wavelet transformation. A driver drives a display with each of the sequence of patterns. A sensor senses a property of the display, such as a total current for the display, for each of the sequence of patterns. An extraction unit derives a pixel non-uniformity model using the sensed properties and an inverse of the transform function. Patterns that contribute less than a threshold amount to the non-uniformity model can be identified and deleted to derive a sparse sequence of patterns, which can be stored in a memory. The sparse sequence of patterns can be used to test the display and extract a set of pixel non-uniformity values. The pixel non-uniformity values can be used to generate a correction signal for the display. |
