发明名称 POWER METAL-OXIDE-SEMICONDUCTOR FIELD EFFECT TRANSISTOR HAVING TRENCH GATE AND METHOD OF MANUFACTURING THE SAME
摘要 <p>Disclosed are a power MOS transistor having a trench gate and a method of manufacturing the same. The disclosed power MOS transistor includes a drift layer which is doped with a first type impurity and has an upper surface where a trench is formed, on a semiconductor substrate which is doped with a first type impurity, a well which is doped with a second type impurity in the bottom of the trench in the drift layer, a source which is doped with the first type impurity in the surface of the wall, a gate insulating layer which is formed on the trench, a gate electrode which is extended from the sidewall of the trench to a part of the source region and the gate insulating layer, a source electrode which is separated from the gate electrode and is on the source region, and a drain electrode which is on the lower part of the substrate.</p>
申请公布号 KR20140045171(A) 申请公布日期 2014.04.16
申请号 KR20120111385 申请日期 2012.10.08
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 SUNG, WOONG JE;UM, CHANG YONG;SHIN, JAI KWANG
分类号 H01L29/78;H01L21/336 主分类号 H01L29/78
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