发明名称 Device interface apparatus and test apparatus
摘要 It is an object of the present invention to test a device under test including an optical interface. Provided is a device interface apparatus on which is loaded a device under test including an optical interface. The device interface apparatus comprises a device loading section on which the device under test is loaded; an optical connector that is to be connected to the optical interface of the device under test; and an optical connector moving section that moves the optical connector toward the optical interface of the device under test loaded on the device loading section, to optically connect the optical connector and the optical interface.
申请公布号 US8699018(B2) 申请公布日期 2014.04.15
申请号 US201113196866 申请日期 2011.08.02
申请人 HARA HIDEO;MASUDA SHIN;ADVANTEST CORPORATION 发明人 HARA HIDEO;MASUDA SHIN
分类号 G01N21/01 主分类号 G01N21/01
代理机构 代理人
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