发明名称 |
Wavelength-classifying type X-ray diffraction device |
摘要 |
A wavelength-classifying type X-ray diffraction device bombards a sample with characteristic X-rays generated from an X-ray generation source, and detects characteristic X-rays diffracted by the sample using an X-ray detector. The X-ray generation source is composed of several metals of different atomic number, respective metals generating several characteristic X-rays of different wavelengths. An X-ray detector is composed of several pixels for receiving X-rays and outputting pulse signals corresponding to X-ray wavelengths. Pixels are respectively furnished with classification circuits. The classification circuits classify and output pixel output signals based on each of characteristic X-ray wavelengths. X-ray intensity is detected on a per-wavelength basis in individual pixels 12. Measurement data based on different wavelength X-rays are acquired simultaneously in just one measurement. Data of diffracted X-rays of different wavelengths are acquired using the entire region of the receiving surface of a two-dimensional detector. |
申请公布号 |
US8699665(B2) |
申请公布日期 |
2014.04.15 |
申请号 |
US201113170708 |
申请日期 |
2011.06.28 |
申请人 |
MATSUSHITA KAZUYUKI;SAKUMURA TAKUTO;TSUJI YUJI;MAEYAMA MASATAKA;HASEGAWA KIMIKO;RIGAKU CORPORATION |
发明人 |
MATSUSHITA KAZUYUKI;SAKUMURA TAKUTO;TSUJI YUJI;MAEYAMA MASATAKA;HASEGAWA KIMIKO |
分类号 |
G01N23/207 |
主分类号 |
G01N23/207 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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