发明名称 Method of forming contact and semiconductor device manufactured by using the method
摘要 A method of forming a contact includes forming an inter-layer dielectric layer to cover a gate formed on a semiconductor substrate; and forming a first hole which passes through the inter-layer dielectric layer to expose the gate, a second hole which exposes an active region of the semiconductor substrate, and a third hole which exposes the semiconductor substrate at a preset depth. Further, the method includes forming a shielding layer on the semiconductor substrate including the bottom and sidewalls of the first hole, the second hole, and the third hole; and removing the shielding layer at the bottom of the first hole and the second hole to expose the gate and the active region. Furthermore, the method includes filling the first hole, the second hole, and the third hole with a conductive material.
申请公布号 US8697483(B2) 申请公布日期 2014.04.15
申请号 US201313758356 申请日期 2013.02.04
申请人 DONGBU HITEK CO., LTD. 发明人 YUN KI JUN
分类号 H01L21/00 主分类号 H01L21/00
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