发明名称 |
TESTING APPARATUS AND ACQUIRING METHOD OF TESTING CONDITION |
摘要 |
The objective of the present invention is to reduce a gap between the results of a user′s environment and a tester′s environment. A determining unit (20) determines whether a DUT (1) passes or fails. A power source circuit (10) has variable characteristics and supplies a power signal to the DUT (1). A condition setting unit (40) executes a pilot test prior to performing a main test on the DUT (1) and obtains a testing condition in the main test. The condtion setting unit (40) can perform the following functions of: (a) measuring the characteristic of a first device on each of a plurality of pilot samples of the DUT (1) while the characteristic of the power source circuit (10) is close to a power characteristic of a user environment actually used by the DUT (1); (b) measuring the predetermined characteristics of a second device on each pilot sample while the characteristic of the power source circuit (10) is close to a power characteristic of a tester environment where the main test is executed; and (c) measuring a testing condition based on the first device characteristic and the second device characteristic. [Reference numerals] (10) Power source circuit; (40) Condition setting unit |
申请公布号 |
KR20140044270(A) |
申请公布日期 |
2014.04.14 |
申请号 |
KR20130117552 |
申请日期 |
2013.10.01 |
申请人 |
ADVANTEST CORPORATION;THE UNIVERSITY OF TOKYO |
发明人 |
ISHIDA MASAHIRO;NAKURA TORU;KOMATSU SATOSHI;ASADA KUNIHIRO |
分类号 |
G01R31/26;H01L21/66 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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