发明名称 |
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
A method of manufacturing a semiconductor device is provided. The method of manufacturing a semiconductor device includes a step of forming a first conductive sacrificial layer on a substrate, a step of forming a second insulating sacrificial layer on the first sacrificial layer, a step of etching the first and the second sacrificial layer and forming an opening part to expose the upper surface of the substrate, a step of conformally forming a seed layer on the first and the second sacrificial layer which have the opening part, and a step of forming a conductive pattern which buries the opening part formed in the seed layer by plating. |
申请公布号 |
KR20140043949(A) |
申请公布日期 |
2014.04.14 |
申请号 |
KR20120104109 |
申请日期 |
2012.09.19 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
MATSUDA TSUKASA;KIM, JIN NAM;YUN, JONG HO;LEE, JONG MYEONG |
分类号 |
H01L21/288;H01L21/28 |
主分类号 |
H01L21/288 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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