在积体电路之序列储存电路内之单一事件扰动错误侦测,申请号TW098107587-传众专利搜索

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法人/股东/高管

发明名称	在积体电路之序列储存电路内之单一事件扰动错误侦测
摘要
申请公布号	TWI434172	申请公布日期	2014.04.11
申请号	TW098107587	申请日期	2009.03.09
申请人	ＡＲＭ股份有限公司英国	发明人	钱德维克斯;伊刚济萨青
分类号	G06F11/16	主分类号	G06F11/16
代理机构		代理人	蔡坤财台北市中山区松江路148号11楼;李世章台北市中山区松江路148号11楼
主权项
地址	英国

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