发明名称 Plasma Etch Resistant Films, Articles Bearing Plasma Etch Resistant Films and Related Methods
摘要 The invention includes a plasma etch-resistant film for a substrate comprising a yttria material wherein at least a portion of the yttria material is in a crystal phase having a crystal lattice structure, wherein at least 50% of the yttria material is in a form of a monoclinic crystal system. The film may be treated by exposure to a fluorine gas plasma. Also included are plasma etch-resistant articles that include a substrate and a film, wherein the film comprises an yttria material and at least a portion of the yttria material is present in the film in a crystal phase having a crystal lattice structure and at least 50% of the yttria material is in a form of a monoclinic crystal system. Several methods are contemplated within the scope of the invention.
申请公布号 US2014099491(A1) 申请公布日期 2014.04.10
申请号 US201213647949 申请日期 2012.10.09
申请人 AMEEN MOHAMMED;LEE SANG-HO;MERCER THOMAS;VORSA VASIL 发明人 AMEEN MOHAMMED;LEE SANG-HO;MERCER THOMAS;VORSA VASIL
分类号 C01F17/00;C23C16/40;H01L21/02 主分类号 C01F17/00
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