发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME, AND ELECTRONIC APPARATUS AND MANUFACTURING METHOD OF THE SAME
摘要 PROBLEM TO BE SOLVED: To improve reliability in a semiconductor device.SOLUTION: A semiconductor device comprises: a substrate 10; a semiconductor element 12 mounted on the substrate 10; a plate-like member 26 which is fixed to on the semiconductor element 12 and has a thermal expansion coefficient different from that of the substrate 10; and a first adhesive 28 which is provided between the substrate 10 and the plate-like member 26 for bonding the substrate 10 with the plate-like member 26, and which is separated from the substrate 10 or the plate-like member 26 in a predetermined condition. With this semiconductor device, reliability in the semiconductor device can be improved depending on a temperature change in use of an electronic apparatus 200 on which the semiconductor device is mounted.
申请公布号 JP2014063921(A) 申请公布日期 2014.04.10
申请号 JP20120208747 申请日期 2012.09.21
申请人 FUJITSU SEMICONDUCTOR LTD 发明人 IHARA TAKUMI
分类号 H01L23/12;H01L23/02 主分类号 H01L23/12
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