| 摘要 |
PROBLEM TO BE SOLVED: To perform flaw detection inspection by bring a coil into which an AC current is caused to flow close to an inner peripheral surface of conductive piping, thereby detecting a change in an eddy current generated in the piping by an electromagnetic phenomenon.SOLUTION: An eddy current flaw detection inspection apparatus includes a probe 130 including a pair of coils 131a, 131b which when being inserted into the inside of piping T, respectively approach diameter-direction opposite portions of the piping out of an inner peripheral surface of the piping T and a signal processor 110 for processing signals of currents respectively flowing from the pair of coils 131a, 131b due to a changes in an eddy current. The signal processor 110 includes an amplitude value addition part for adding with time an amplitude value of a signal of a current flowing from the coil 131a due to a change in an eddy current generated by the coil 131a and an amplitude value of a signal of a current flowing from the coil 131b due to a change in an eddy current generated by the coil 131b and a defective signal output part for outputting a signal indicating a change over time of an addition value obtained by adding the amplitude values by the amplitude value addition part as a signal indicating a defect of the piping T. |
