发明名称 DEPOSITION METHOD AND DEPOSITION APPARATUS
摘要 Disclosed is a method for depositing an insulating film with a high coverage through a low temperature process. The deposition method deposits an insulating film on a substrate using a deposition apparatus which includes a processing container that defines a processing space in which plasma is generated, a gas supply unit configured to supply a gas into the processing space, and a plasma generating unit configured to generate plasma by supplying microwave into the processing container. The deposition method includes depositing an insulating film that includes SiN on the substrate by supplying into a gas formed by adding H2 to trisilylamine into the processing container and generating plasma.
申请公布号 US2014099734(A1) 申请公布日期 2014.04.10
申请号 US201314041004 申请日期 2013.09.30
申请人 TOKYO ELECTRON LIMITED 发明人 SAITO TAKEHISA;INOKUCHI ATSUTOSHI;MASUDA SHOGO
分类号 H01L21/02;C23C16/511 主分类号 H01L21/02
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