| 摘要 |
<p>A method for detecting electromagnetic property of oriented silicon steel, the method comprises: measuring Euler angles of each of crystal grains in a specimen by use of metallographic etch-pit method; calculating orientation deviation angle ¸ i (degree) of the crystal grain; combining area Si (mm 2 ) of the crystal grain and correction coefficient X of element Si (X=0.1~10T/degree); correcting on the basis of the magnetic property B 0 (saturation magnetic induction, T) of single-crystal material by using these parameters (¸ i , S i , X), formula for correcting is
obtaining electromagnetic property B 8 of the oriented silicon steel by the above calculations. The present invention can implement detection of electromagnetic property of a specimen under the circumstances that there is no magnetism measuring device or that magnetism measuring devices cannot be used due to reasons such as weight and size of the specimen being too small or surface quality of the specimen being poor.</p> |
