发明名称 |
SUBSTRATE PROCESSING APPARATUS, SUBSTRATE PROCESSING METHOD AND SEMICONDUCTOR DEVICE MANUFACTURING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To enable stable temperature control by using a radiation thermometer and enable formation of a good silicon carbide film.SOLUTION: A substrate processing apparatus comprises: a substrate holder for holding a substrate; a cylindrical heat generator which is arranged to surround the substrate holder and composes a reaction chamber; a reaction tube arranged to surround the cylindrical heat generator; and a radiation thermometer arranged under a lower end of the reaction tube, for measuring a temperature of the cylindrical heat generator. The cylindrical heat generator is composed of a plurality of ring-shaped members stacked along a longer direction, in which at least one among the ring-shaped members includes a projection arranged on an outer peripheral part of the ring-shaped member, for measuring the temperature by the radiation thermometer. |
申请公布号 |
JP2014063820(A) |
申请公布日期 |
2014.04.10 |
申请号 |
JP20120207020 |
申请日期 |
2012.09.20 |
申请人 |
HITACHI KOKUSAI ELECTRIC INC |
发明人 |
MUROBAYASHI MASASUE;YAMAGUCHI TENWA;SHIRAKO KENJI;NISHIDO SHUHEI |
分类号 |
H01L21/205;C23C16/46;H01L21/22;H01L21/302;H01L21/3065 |
主分类号 |
H01L21/205 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|