发明名称 SUBSTRATE PROCESSING APPARATUS, SUBSTRATE PROCESSING METHOD AND SEMICONDUCTOR DEVICE MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To enable stable temperature control by using a radiation thermometer and enable formation of a good silicon carbide film.SOLUTION: A substrate processing apparatus comprises: a substrate holder for holding a substrate; a cylindrical heat generator which is arranged to surround the substrate holder and composes a reaction chamber; a reaction tube arranged to surround the cylindrical heat generator; and a radiation thermometer arranged under a lower end of the reaction tube, for measuring a temperature of the cylindrical heat generator. The cylindrical heat generator is composed of a plurality of ring-shaped members stacked along a longer direction, in which at least one among the ring-shaped members includes a projection arranged on an outer peripheral part of the ring-shaped member, for measuring the temperature by the radiation thermometer.
申请公布号 JP2014063820(A) 申请公布日期 2014.04.10
申请号 JP20120207020 申请日期 2012.09.20
申请人 HITACHI KOKUSAI ELECTRIC INC 发明人 MUROBAYASHI MASASUE;YAMAGUCHI TENWA;SHIRAKO KENJI;NISHIDO SHUHEI
分类号 H01L21/205;C23C16/46;H01L21/22;H01L21/302;H01L21/3065 主分类号 H01L21/205
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