发明名称 EGG INSPECTION APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide an egg inspection apparatus capable of highly accurately and relatively inexpensively inspecting various types of states of eggs without being affected by structural factors of the eggs.SOLUTION: An egg inspection apparatus 10A according to the present invention includes: support parts 11 for supporting eggs 1; a temperature measuring section 20A consisting of three temperature sensors 20a, 20b, and 20c that move relative to an egg 1 supported by the support parts 11, contactlessly measure temperatures of predetermined areas of the egg 1, and output temperature data relating to the temperatures; and an inspection section 21A that inspects a state of the egg 1 on the basis of a change generated by the relative movement of the temperature data output from the temperature measuring section 20A.
申请公布号 JP2014060957(A) 申请公布日期 2014.04.10
申请号 JP20120208335 申请日期 2012.09.21
申请人 NABERU:KK 发明人 FUJITANI SHINICHI;HASEGAWA TAKAYUKI;SHIGITANI HITOMI
分类号 A01K43/00;G01J5/00;G01J5/12 主分类号 A01K43/00
代理机构 代理人
主权项
地址
您可能感兴趣的专利