| 摘要 |
PROBLEM TO BE SOLVED: To provide a fine particle analyzer capable of improving the analysis accuracy of detection of forward scattered light generated from a fine particle to be analyzed.SOLUTION: There is provided the fine particle analyzer that comprises a light detection part for detecting forward scattered light generated from a fine particle to be analyzed. The light detection part includes a circuit having a high pass filter which removes low frequency noise contained in light entering the light detection part. A circuit is switched to the circuit having the high pass filter according to a predetermined frequency of the forward scattered light. The configuration of the fine particle analyzer makes it possible to remove the low frequency noise by the high pass filter even when the low frequency noise, which is caused by mechanical vibration and the like in the structure of the analyzer, enters the light detection part. |
