| 摘要 |
A test circuit may include an analog signal generator having an output and configured to generate an analog output signal at the output in accordance with a timing parameter; an analog-to-digital converter (ADC) having an input connected to the output of the analog signal generator, and an output and configured to generate a first digital output signal dependent on the analog signal; and a configurable digital signal generator comprising an output and configured to generate a second digital output signal in accordance with the timing parameter at the output. |
