发明名称 SAMPLE ANALYSIS DEVICE, SAMPLE ANALYSIS METHOD, SAMPLE ANALYSIS PROGRAM, AND PARTICLE TRACK ANALYSIS DEVICE
摘要 PROBLEM TO BE SOLVED: To detect a recessed portion and a protruded portion of a sample to determine if the detected portion is a recess or a protrusion.SOLUTION: A recess detection unit detects, as a recess recessed from an imaging surface, each of portions 203d and 201d in which a proximity image 203c has a large luminance value that is photographed while a focal position of an object lens 31 is moved to a proximity position, and a separation image 201c has a small luminance value that is photographed while the focal position is moved to a separation position. A protrusion detection unit detects, as a protrusion protruding from the imaging surface, each of portions 201b and 203b in which a separation image 201a has a large luminance value and the proximity image 203a has a small luminance value.
申请公布号 JP2014062936(A) 申请公布日期 2014.04.10
申请号 JP20120206493 申请日期 2012.09.20
申请人 SEIKO PRECISION INC 发明人 UMESHIMA YOSUKE
分类号 G02B21/00 主分类号 G02B21/00
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