发明名称 INSPECTION METHOD AND INSPECTION SYSTEM
摘要 FIELD: physics.SUBSTANCE: method involves two-sided scanning of the inspected person with thin beams of X-rays from two X-ray sources placed at different sides of the inspected person by vertical sweeping through linear vertical movement of said sources using carriages fitted with an electric drive and horizontal sweeping using collimators and picking up backscattered X-rays using a detector mounted at each carriage to form raster images of the inspected person in one scanning cycle, wherein linear vertical movement of both X-ray sources is carried out simultaneously and asynchronously with delay of the beginning of scanning one relative to the other, and scattered X-rays, passing from an opposite X-ray source, is absorbed by protective shields at each of the detectors.EFFECT: high throughput when inspecting people.9 cl, 2 dwg
申请公布号 RU2512679(C1) 申请公布日期 2014.04.10
申请号 RU20120150568 申请日期 2012.11.27
申请人 OBSHCHESTVO S OGRANICHENNOJ OTVETSTVENNOST'JU "FLEHSH EHLEKTRONIKS" 发明人 BLOKHIN EVGENIJ OLEGOVICH;BUKLEJ ALEKSANDR ALEKSANDROVICH;PARSHIN IL'JA ALEKSANDROVICH;PASHINTSEV FEDOR ARKAD'EVICH;FEDOROVSKIJ EVGENIJ VLADIMIROVICH
分类号 G01N23/00 主分类号 G01N23/00
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