发明名称 |
TEST STRUCTURE FOR ASSESSMENT OF RADIUS OF CURVATURE OF NEEDLE EDGE OF CANTILEVER OF SCANNING PROBING MICROSCOPE |
摘要 |
FIELD: measuring equipment.SUBSTANCE: test structure consists of base containing a near-surface layer. The near-surface layer has a relief cellular structure with dense packing. The adjacent cells have the common wall, and each cell is at least five-wall. Walls of each cell are located vertically, and the upper edges of walls of cells have a concave form. The test structure contains the edges having radius of curvature of tops of a nanometer range. Edges are executed by connection in central places of three top edges of walls of various cells. Edges at tops are executed from titanium oxide. The near-surface layer of the basis is executed from titanium. The base can be executed from titanium. The basis also can be executed in the form of a substrate, on which the film of titanium containing a near-surface layer of the basis is located.EFFECT: reproducibility increase in determination of radius of curvature of an edge of a needle in a cantilever.2 cl, 2 dwg |
申请公布号 |
RU2511025(C1) |
申请公布日期 |
2014.04.10 |
申请号 |
RU20120140769 |
申请日期 |
2012.09.25 |
申请人 |
FEDERAL'NOE GOSUDARSTVENNOE AVTONOMNOE OBRAZOVATEL'NOE UCHREZHDENIE VYSSHEGO PROFESSIONAL'NOGO OBRAZOVANIJA "NATSIONAL'NYJ ISSLEDOVATEL'SKIJ UNIVERSITET "MIEHT" (NATSIONAL'NYJ ISSLEDOVATEL'SKIJ UNIVERSITET MIEHT) |
发明人 |
BELOV ALEKSEJ NIKOLAEVICH;GAVRILOV SERGEJ ALEKSANDROVICH;DRONOV ALEKSEJ ALEKSEEVICH;SHEVJAKOV VASILIJ IVANOVICH |
分类号 |
G01Q40/02;B82Y35/00 |
主分类号 |
G01Q40/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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