发明名称 TEST STRUCTURE FOR ASSESSMENT OF RADIUS OF CURVATURE OF NEEDLE EDGE OF CANTILEVER OF SCANNING PROBING MICROSCOPE
摘要 FIELD: measuring equipment.SUBSTANCE: test structure consists of base containing a near-surface layer. The near-surface layer has a relief cellular structure with dense packing. The adjacent cells have the common wall, and each cell is at least five-wall. Walls of each cell are located vertically, and the upper edges of walls of cells have a concave form. The test structure contains the edges having radius of curvature of tops of a nanometer range. Edges are executed by connection in central places of three top edges of walls of various cells. Edges at tops are executed from titanium oxide. The near-surface layer of the basis is executed from titanium. The base can be executed from titanium. The basis also can be executed in the form of a substrate, on which the film of titanium containing a near-surface layer of the basis is located.EFFECT: reproducibility increase in determination of radius of curvature of an edge of a needle in a cantilever.2 cl, 2 dwg
申请公布号 RU2511025(C1) 申请公布日期 2014.04.10
申请号 RU20120140769 申请日期 2012.09.25
申请人 FEDERAL'NOE GOSUDARSTVENNOE AVTONOMNOE OBRAZOVATEL'NOE UCHREZHDENIE VYSSHEGO PROFESSIONAL'NOGO OBRAZOVANIJA "NATSIONAL'NYJ ISSLEDOVATEL'SKIJ UNIVERSITET "MIEHT" (NATSIONAL'NYJ ISSLEDOVATEL'SKIJ UNIVERSITET MIEHT) 发明人 BELOV ALEKSEJ NIKOLAEVICH;GAVRILOV SERGEJ ALEKSANDROVICH;DRONOV ALEKSEJ ALEKSEEVICH;SHEVJAKOV VASILIJ IVANOVICH
分类号 G01Q40/02;B82Y35/00 主分类号 G01Q40/02
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