发明名称 SYSTEMS AND METHODS FOR WEIGH SCALE PERIMETER MONITORING FOR SCANNER-SCALES
摘要 <p>Systems and methods for reducing erroneous weighing of items such as by detecting items extending beyond a periphery of a weigh platter whereby in one configuration, the system employs a light guide for routing a light beam to a detector operative to detect interruption of the beam due to an item encroaching upon or overhanging an edge of the platter. In another configuration, the scale includes a perimeter gap between the platter outer edge and scanner housing frame or checkout counter, a light beam directed angularly upward through the gap is partially obstructed by the frame and platter whereby light exits the gap forming a light plane, wherein an object placed on the platter extending across the gap intersects the light plane thus scattering light rays, some of which are sensed by a detector. Various indicators for alerting the operator of off-scale detection are also described.</p>
申请公布号 EP2715608(A2) 申请公布日期 2014.04.09
申请号 EP20120793458 申请日期 2012.06.01
申请人 DATALOGIC ADC, INC. 发明人 O'DONNELL, PATRICK, M.;MCQUEEN, ALEXANDER, M.
分类号 G06K7/10;G01G19/00;G06K9/18 主分类号 G06K7/10
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