发明名称 |
SYSTEMS AND METHODS FOR WEIGH SCALE PERIMETER MONITORING FOR SCANNER-SCALES |
摘要 |
<p>Systems and methods for reducing erroneous weighing of items such as by detecting items extending beyond a periphery of a weigh platter whereby in one configuration, the system employs a light guide for routing a light beam to a detector operative to detect interruption of the beam due to an item encroaching upon or overhanging an edge of the platter. In another configuration, the scale includes a perimeter gap between the platter outer edge and scanner housing frame or checkout counter, a light beam directed angularly upward through the gap is partially obstructed by the frame and platter whereby light exits the gap forming a light plane, wherein an object placed on the platter extending across the gap intersects the light plane thus scattering light rays, some of which are sensed by a detector. Various indicators for alerting the operator of off-scale detection are also described.</p> |
申请公布号 |
EP2715608(A2) |
申请公布日期 |
2014.04.09 |
申请号 |
EP20120793458 |
申请日期 |
2012.06.01 |
申请人 |
DATALOGIC ADC, INC. |
发明人 |
O'DONNELL, PATRICK, M.;MCQUEEN, ALEXANDER, M. |
分类号 |
G06K7/10;G01G19/00;G06K9/18 |
主分类号 |
G06K7/10 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|